Diffraction Structure — Insights into the electric double-layer capacitance of two-dimensional electrically conductive metal-organic frameworks

Measurement evidence

Diffraction Structure

Insights into the electric double-layer capacitance of two-dimensional electrically conductive metal-organic frameworks · Gittins J.W., Balhatchet C.J., Chen Y. et al. · Journal of Materials Chemistry A · 2021 · 16006-16015

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (PXRD), non-monochromated Cu Kalpha radiation

X-ray diffraction and scattering

as-synthesised Cu3(HHTP)2 powder · Powder

Room temperature; 2theta range 3-50 deg; step size 0.017 deg; sum average of 15 scans; capillary sealed in N2-filled glovebox.

Atmosphere: sample loaded and sealed in N2-filled glovebox
Geometry: borosilicate glass capillary
Context: pristine Cu3(HHTP)2 powder
Measurement source: p007 · X-ray diffraction · Fig. 1; Figs. S1-S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PXRD agreement with simulated structures	Experimental PXRD pattern compares well to both eclipsed and near-eclipsed simulated Cu3(HHTP)2 patterns; data insufficient for Rietveld refinement.	—	—	Caption Qualitative	p004 · Figure S1-S2 captions · Figs. S1-S2