Harmonised methods
Browse reviewed technique groups that connect FTIR with IR and ATR-FTIR, PXRD with XRD terminology, and other spelling or abbreviation variants—without discarding measurement geometry or purpose.
A combined “SEM and TEM” measurement can appear in both technique groups. ATR, transmission and diffuse-reflectance IR share a parent but retain their subtype. Technique counts therefore overlap and should not be summed.
40 technique groups
Vocabulary and limitations →XRD, PXRD, SCXRD and grazing-incidence diffraction/scattering, with geometry retained as a subtype.
Powder X-ray diffraction · powder X-ray diffraction · Powder X-ray diffraction (PXRD)
SEM and FE-SEM imaging, including cross-sections and morphology analysis.
SEM · Scanning electron microscopy (SEM) · SEM and TEM
Two- and four-contact conductivity, current-voltage and van der Pauw measurements.
two-contact-probe electrical conductivity from linear regression of J-E curves · variable-temperature two-contact I-V curves fitted to Arrhenius law · Four-point probe conductivity
IR, FTIR, ATR-FTIR, transmission IR and diffuse-reflectance variants.
FT-IR spectroscopy · FTIR spectroscopy · FTIR
XPS survey, core-level, valence-band and fitted-component measurements.
X-ray photoelectron spectroscopy (XPS) · X-ray photoelectron spectroscopy · XPS
Gas adsorption/desorption, BET, BJH and pore-size analyses.
N2 adsorption-desorption; BET, t-plot and BJH analyses · N2 adsorption isotherm · N2 adsorption isotherm and BET surface area
Cyclic, linear-sweep, differential-pulse, square-wave and stripping voltammetry.
Cyclic voltammetry · cyclic voltammetry · Cyclic voltammetry (CV)
TEM, HRTEM and STEM imaging and diffraction variants.
SEM and TEM · TEM · FE-SEM and TEM
Electrical and electrochemical impedance, dielectric and equivalent-circuit measurements.
Electrochemical impedance spectroscopy (EIS) · electrochemical impedance spectroscopy · Electrochemical impedance spectroscopy
UV-vis, UV-vis-NIR, optical absorption, diffuse-reflectance and Tauc/Kubelka-Munk variants.
UV-vis absorption spectroscopy · DR-UV-vis-NIR plus DRIFTS, Tauc analysis · UV-vis spectroscopy
EDS/EDX mapping and related microscope-coupled elemental analysis.
SEM and EDS mapping · Energy-dispersive X-ray spectroscopy (EDS) · SEM, TEM and EDS mapping
TGA, DTG and coupled thermogravimetric measurements.
Thermogravimetric analysis · thermogravimetric analysis · Thermogravimetric analysis (TGA)
DFT electronic-structure, geometry, energetics and derived-property calculations.
spin-polarised DFT magnetic moment · DFT in VASP; PBEsol structural relaxation and single-point HSE06 electronic properties · DFT band structure and PDOS
Combustion elemental analysis, ICP, atomic absorption, XRF and related bulk-composition methods.
Elemental analysis · ICP-MS · ICP-OES
Constant-current charge-discharge, chronopotentiometry and galvanostatic cycling protocols.
galvanostatic charge-discharge (GCD) · galvanostatic charge-discharge · Galvanostatic cycling
Conventional, resonance, variable-temperature and in-situ Raman methods.
Raman spectroscopy · FT-IR and Raman spectroscopy · FTIR and Raman spectroscopy
EPR/ESR and related spin-resonance measurements.
EPR spectroscopy · Electron paramagnetic resonance (EPR) · Electron paramagnetic resonance spectroscopy
AFM topography, thickness, roughness and force-derived measurements.
SEM and AFM · AFM thickness measurement · Atomic force microscopy (AFM)
Current-time measurements at fixed applied potential.
Chronoamperometry · chronoamperometry · chronoamperometry / Cottrell analysis
Steady-state and time-resolved photoluminescence, fluorescence and emission-lifetime measurements.
Photoluminescence spectroscopy · solid-state fluorescence / photoluminescence · diffuse-reflectance UV-vis and photoluminescence spectroscopy; Tauc analysis
XAS, XANES and EXAFS measurements across reported absorption edges.
Cu K-edge XANES/EXAFS · Ni K-edge XANES/EXAFS · Zn K-edge EXAFS/XANES with FEFF fitting
Tafel slopes, potentiodynamic polarisation and Koutecky-Levich kinetic analyses.
Tafel analysis · RDE OER electrochemistry: LSV, Tafel, CV Cdl, EIS · OER polarisation and Tafel analysis
Solution and solid-state NMR measurements.
Quantitative 1H NMR and TGA purity analysis · 7Li solid-state MAS NMR inversion-recovery T1 · 1H NMR and powder X-ray diffraction (PXRD)
SQUID/VSM magnetometry, magnetic susceptibility, magnetisation and Curie-Weiss analyses.
UV-vis absorption in DMF and room-temperature magnetic susceptibility · Elemental analysis, IR (KBr), UV-visible (Nujol), magnetic susceptibility, decomposition point · Diffuse reflectance spectra and Gouy magnetic susceptibility
Photocurrent, photoelectrochemical response, photodetector and IPCE/EQE measurements.
transient photocurrent · Linear sweep voltammetry photocurrent · Transient photocurrent response
DSC, DTA, calorimetry, heat-capacity and specific-heat measurements.
TGA-DTA/DTG using Perkin Elmer Diamond Thermal Analyzer · thermogravimetric analysis / differential thermal analysis (TG/DTA) · TGA/DTA
Sessile-drop, water/electrolyte contact-angle, wettability and OWRK surface-energy analyses.
water contact angle · Water contact angle · Contact angle goniometry
UPS and photoelectron-yield measurements used for frontier-level estimates.
Ultraviolet photoelectron spectroscopy (UPS) · ultraviolet photoelectron spectroscopy · Ultraviolet photoelectron spectroscopy
Hall coefficient, carrier density and Hall mobility measurements.
Hall effect measurement, five-probe method in Quantum Design PPMS-Evercool II · Hall effect measurement · van der Pauw method (Lakeshore Hall Testing System)
Colloidal particle size, hydrodynamic diameter, electrophoretic mobility and zeta-potential measurements.
Dynamic light scattering · zeta potential · Zeta potential
Three-dimensional electron diffraction, cRED, MicroED and related structure-solution methods.
3D electron diffraction; ab initio solution and SHELXL refinement · PXRD and MicroED/Pawley structural analysis · AC-HRTEM and electron diffraction
FET, TFT and transistor transfer/output characterisation.
BG-TC TFT transfer/output characterization · Agilent 4155C semiconductor parameter analyser; top-contact bottom-gate OFET · field-effect transistor transfer measurement
SCLC and Mott-Gurney current-voltage analyses used to estimate carrier mobility and trap behaviour.
Space-charge limited current (SCLC) mobility extraction · SCLC hole-only device fitting · Space-charge-limited-current analysis using Mott-Gurney equation
Seebeck coefficient, thermovoltage and thermopower measurements.
Seebeck coefficient measurement · Elemental analysis plus 300 K electrical conductivity, Seebeck coefficient and power factor · Four-probe electrical conductivity with Loresta-GX MCP-T700; lab-made Seebeck setup with Peltier plates
Classical and first-principles molecular-dynamics simulations.
Axial water diffusion coefficient Dz from MD mean-square displacement slope · MD water density during M-HAB equilibration · AIMD with CP2K plus pre-equilibrated GROMACS MD
Capacitance-potential Mott-Schottky measurements and simulations used for flat-band and carrier analyses.
Mott-Schottky analysis · SCAPS-1D capacitance-voltage / Mott-Schottky simulation · Mott-Schottky plot
THz time-domain and optical-pump terahertz-probe spectroscopy, including photoconductivity fits.
Frequency-resolved complex THz photoconductivity fitted by Drude-Smith model · Optical-pump terahertz-probe (OPTP) photoconductivity dynamics · Time-resolved terahertz spectroscopy (TRTS)
Femtosecond, nanosecond, flash-photolysis and transient-absorption microscopy variants.
ultrafast transient absorption · Femtosecond optical transient absorption (OTA) spectroscopy · Femtosecond ultrafast transient absorption spectroscopy
Mossbauer measurements, including isotope-labelled and variable-temperature variants.
57Fe Mossbauer spectroscopy · 57Fe Moessbauer spectroscopy with Lorentzian fitting · Iron-57 Mossbauer spectroscopy
Thermal conductivity and diffusivity measurements, including TDTR and laser-flash methods.
Temperature-dependent conductivity, Seebeck coefficient, thermal conductivity and calculated ZT · Electrical conductivity, Seebeck coefficient, Raman thermometry thermal conductivity, power factor and zT · Steady-state thermal conductivity measurement.
No technique group matches these filters.