van der Pauw electrical conductivity and variable-temperature Arrhenius analysis
Cu3(HFcHBC)2 polycrystalline film · Thin Film
Thin films on Si/SiO2; silver-conductive glue contacts; measured 320-100 K with Lakeshore Hall System; I-V collected from -10 nA to 10 nA after Ohmic contact confirmation.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| film Arrhenius activation energy | approximately 148 meV | 0.148 eV | — | Text Approximate | 6 · Charge transport properties · Figure 4a |
| film conductivity at 300 K | 0.037 S cm-1 at 300 K | — | — | Text Exact Reported | 6 · Charge transport properties · Figure 4a |
| film conductivity decrease from 310 to 100 K | decreases by 4 orders of magnitude from 310 to 100 K | — | — | Text Rounded Reported | 6 · Charge transport properties |