SEM, EDX, HRTEM/FFT
Ag4TSHQ powder · Powder
SEM/EDS after dispersion in EtOH on conductive silicon with Pt coating; TEM at 120 kV on carbon-coated copper grid.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRTEM/FFT d-spacing along (200) | 9.1 Angstrom | — | — | Text Rounded Reported | 3 · Synthesis and Structural Characterization of Ag4TSHQ · Figure 2b |
| crystal size description | micrometer-sized crystals | — | — | Text Qualitative | 3 · Synthesis and Structural Characterization of Ag4TSHQ · Figure 2b |
| first strongest PXRD peak | 2theta = 4.36 deg | — | — | Text Exact Reported | 3 · Synthesis and Structural Characterization of Ag4TSHQ · Figure 2b |