XRD, FT-IR, ICP-OES and XPS characterisation
Infrared spectroscopyX-ray photoelectron spectroscopyX-ray diffraction and scatteringBulk elemental and compositional analysis
HE-MOF nanosheet array electrode on nickel foam · Electrode
As-prepared HE-MOF compared with Ni-MOF and ligand; XPS Al K alpha, 0-1400 eV.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HE-MOF ICP-OES Co fraction | Co of 20.1% | — | — | Text Exact Reported | 14096 · 3.1. Material Characterizations · Figure 1d |
| HE-MOF ICP-OES Fe fraction | Fe of 19.04% | — | — | Text Exact Reported | 14096 · 3.1. Material Characterizations · Figure 1d |
| HE-MOF ICP-OES Mo fraction | Mo of 16.88% | — | — | Text Exact Reported | 14096 · 3.1. Material Characterizations · Figure 1d |
| HE-MOF ICP-OES Ni fraction | Ni of 23.17% | — | — | Text Exact Reported | 14096 · 3.1. Material Characterizations · Figure 1d |
| HE-MOF ICP-OES Zn fraction | Zn of 20.81% | — | — | Text Exact Reported | 14096 · 3.1. Material Characterizations · Figure 1d |