cMOF Evidence Base
Diffraction Structure — Metal-organic frameworks with fine-tuned interlayer spacing for microwave absorption

Measurement evidence

Diffraction Structure

Metal-organic frameworks with fine-tuned interlayer spacing for microwave absorption · Zhang X., Tian X., Wu N. et al. · Science Advances · 2024 · eadl6498

1 measurement group · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD with Cu K-alpha radiation

X-ray diffraction and scattering

Zn3Cu1-HHTP powder/rod crystals · Powder

XRD DMAX-2500PC; 2 theta range 3 to 60 degrees.

Context
pristine ZnCu-HHTP series
Measurement source
2, 8 · Results; Characterization · Fig. 2C; Table S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Interlayer spacing, Cu-HHTP3.188467 A——SI Table
Exact Reported		11 · Table S3 · Table S3
PXRD (100) reflectionaround 4.7 degrees 2theta——Text
Approximate		2 · Results · Fig. 2C
Interlayer spacing, Zn1Cu3-HHTP3.164293 A——SI Table
Exact Reported		11 · Table S3 · Table S3
Interlayer spacing, Zn2Cu2-HHTP3.14766 A——SI Table
Exact Reported		11 · Table S3 · Table S3
Interlayer spacing, Zn3Cu1-HHTP3.137896 A——SI Table
Exact Reported		11 · Table S3 · Table S3
Interlayer spacing, Zn-HHTPMarked as a best value within this paper3.134655 A——SI Table
Exact Reported		11 · Table S3 · Table S3