Cheung analysis of forward-bias J-V characteristics
ITO/1/Al thin-film Schottky device · Thin Film
dV/d ln J versus J and H(J) versus J curves in absence of light
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Schottky barrier height from H(J)-J | 0.60 eV | — | — | Table Exact Reported | 7 · Electrical Characterization · Table 1 |
| Schottky barrier height from ln J-V plotMarked as a best value within this paper | 0.65 eV | — | — | Table Exact Reported | 7 · Electrical Characterization · Table 1 |
| ideality factor from dV/dlnJ-J | 4.20 | — | — | Table Exact Reported | 7 · Electrical Characterization · Table 1 |
| ideality factor from ln J-V plot | 4.44 | — | — | Table Exact Reported | 7 · Electrical Characterization · Table 1 |
| series resistance from dV/dlnJ-JMarked as a best value within this paper | 0.03 ohm | — | — | Table Exact Reported | 7 · Electrical Characterization · Table 1 |
| series resistance from H(J)-J | 0.026 ohm | — | — | Table Exact Reported | 7 · Electrical Characterization · Table 1 |