Diffraction Structure — Two-Dimensional Conductive Metal-Organic Frameworks Based on Truxene

Measurement evidence

Diffraction Structure

Two-Dimensional Conductive Metal-Organic Frameworks Based on Truxene · Zhao Q., Li S.-H., Chai R.-L. et al. · ACS Applied Materials and Interfaces · 2020 · 7504-7509

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction with Cu Kalpha radiation; simulated patterns calculated with Material Studio Forcite and Mercury

truxene-Cu cMOF black powder · Powder

RIGAKU SMART LAB X-ray diffractometer; Cu Kalpha lambda = 1.5406 Angstrom; 9000 W, 45 kV, 200 mA.

Geometry
powder
Context
pristine cMOF
Measurement source
7505 · Results and Discussion · Figure 1b-c
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
[001] reflection peak position2theta = 27.53 degText
Exact Reported
7505 · Results and Discussion · Figure 1b
PXRD prominent in-plane peaks2theta = 3.86, 7.72, 10.23, and 17.76 degText
Exact Reported
7505 · Results and Discussion · Figure 1b
unit-cell a parametera = b = 26.56 AngstromText
Exact Reported
7505 · Results and Discussion · Figure 1
unit-cell c parameterc = 3.22 AngstromText
Exact Reported
7505 · Results and Discussion · Figure 1