Microscopy Morphology — Molecular-Level Pore Tuning in 2D Conductive Metal-Organic Frameworks for Advanced Supercapacitor Performance

Measurement evidence

Microscopy Morphology

Molecular-Level Pore Tuning in 2D Conductive Metal-Organic Frameworks for Advanced Supercapacitor Performance · Lee G., Park G., Park S.S. · Journal of the American Chemical Society · 2024 · 29767-29772

1 measurement group · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and TEM

Cu3(HHTATP)2 dark powder · Powder

SEM at 5 kV; TEM at 200 kV after methanol dispersion/drop-casting onto Cu TEM grids.

Context
pristine
Measurement source
S6-S12 · Electron microscopy · Figures S1 and S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
FFT labelled spacing1.86 nmFigure Axis
Rounded Reported
S11 · Figure S4 · Figure S4
Morphologystacked nanoflake morphologyText
Qualitative
29768 · Results and Discussion · Figure S1
TEM lattice assignmenthoneycomb lattice viewed along [001]Text
Qualitative
29768 · Results and Discussion · Figure S4