Microscopy Morphology — Underpinning the conductivity mechanism in wide bandgap metal organic framework through chemical sensing

Measurement evidence

Microscopy Morphology

Underpinning the conductivity mechanism in wide bandgap metal organic framework through chemical sensing · Pulumati N.B., Urs Mb K., Mandal S. et al. · AIP Advances · 2020 · 085105

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

FESEM and EDS / EDS mapping

Scanning electron microscopy Elemental microanalysis and mapping

50-50 Zn:Co ZIF powder · Powder

FEI FESEM at 5 kV bias voltage; SEM images and EDS spectra for ZIF-8, ZIF-67, and mixture; EDS mapping for 50-50 mixture.

Context: Series comparison.
Measurement source: p006-p008 · Scanning electron microscopy · Fig. S3; Fig. S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
50-50 mixture EDS mapping	uniformly distributed Zn and Co ions along with carbon and nitrogen	—	—	Text Qualitative	p007 · Scanning electron microscopy · Fig. S4
ZIF-67 EDS metal presence	Co present in ZIF-67	—	—	Text Qualitative	p007-p008 · Scanning electron microscopy · Fig. S3
ZIF-8 EDS metal presence	Zn present in ZIF-8	—	—	Text Qualitative	p007-p008 · Scanning electron microscopy · Fig. S3
MOF particle size from SEM	about 100 nm	—	—	Text Approximate	p007-p008 · Scanning electron microscopy · Fig. S3