SEM-EDX and ICP-MS
Scanning electron microscopyElemental microanalysis and mappingBulk elemental and compositional analysis
as-made MUV-35 crystals · Single Crystal
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX Mn atomic fraction | 25.37% | — | — | Caption Rounded Reported | 10 · S.3.1 · Figure S4 |
| EDX Ti:Mn:S ratio | 13.18:25.37:61.45 at.% | — | — | Caption Rounded Reported | 10 · S.3.1 · Figure S4 |
| EDX S atomic fraction | 61.45% | — | — | Caption Rounded Reported | 10 · S.3.1 · Figure S4 |
| EDX Ti atomic fraction | 13.18% | — | — | Caption Rounded Reported | 10 · S.3.1 · Figure S4 |
| ICP-MS Mn fraction | Mn (%): 26.1 | — | — | Text Rounded Reported | 9 · S.3.1 |
| ICP-MS S fraction | S (%): 60.8 | — | — | Text Rounded Reported | 9 · S.3.1 |
| ICP-MS Ti fraction | Ti (%): 13.1 | — | — | Text Rounded Reported | 9 · S.3.1 |