Measurement evidence
Development of a UiO-Type Thin Film Electrocatalysis Platform with Redox-Active Linkers · Johnson B.A., Bhunia A., Fei H. et al. · Journal of the American Chemical Society · 2018 · 2985-2994
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Zr(dcphOH-NDI) bulk microcrystalline powder · Powder
Bulk powder PXRD compared to simulated UiO/PIZOF Zr-L6 pattern; stability checks after DMF, H2O, air, N2 sorption, and titration.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PXRD structure assignment | UiO/PIZOF connectivity with Zr6O4(OH)4 nodes and 2-fold interpenetration | — | — | Text Qualitative | main p.2 · Synthesis and Characterization · Figure S1 |
Zr(dcphOH-NDI)@FTO thin film · Thin Film
Thin film on FTO characterised by PXRD, SEM, XPS Zr 3d/N 1s/C 1s; XPS used Al K-alpha radiation and C 1s correction.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Film thicknessMarked as a best value within this paper | ca. 1 um | — | — | Caption Approximate | SI p.S5 · Figure captions · Figure S8 |
| XPS Zr 3d peak 2 | 184.7 eV | — | — | Text Exact Reported | main p.4 · Thin Film Characterization · Figure 5c |
| XPS Zr 3d peak 1 | 182.3 eV | — | — | Text Exact Reported | main p.4 · Thin Film Characterization · Figure 5c |
| NDI carbonyl C 1s binding energy | around 288.0 eV | — | — | Text Approximate | main p.4 · Thin Film Characterization · Figure S9 |
| SAM N 1s binding energy | 399.9 eV | — | — | Text Exact Reported | main p.4 · Thin Film Characterization · Figure 5d |