Powder X-ray diffraction; Pawley refinement
NiPc-Ni powder/nanosheets · Nanosheet
PANalytical Empyrean, Cu Kalpha radiation 1.540598 Angstrom, 40 kV, 40 mA; structure compared with DFT-optimised eclipsed AA stacking.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| lattice parameter a | 17.8963 Angstrom | — | — | SI Table Exact Reported | 5 · PXRD Measurements · Table S1 |
| lattice parameter c | 3.4372 Angstrom | — | — | SI Table Exact Reported | 5 · PXRD Measurements · Table S1 |
| assigned PXRD peaks | 4.9, 7.0, 9.9 and 26.5 degrees 2theta assigned to (100), (110), (200) and (001) | — | — | Text Rounded Reported | 1624 · Synthesis and characterization · Fig. 2 |
| Pawley refinement Rwp | Rwp of 2.78% | — | — | Text Exact Reported | 1624 · Synthesis and characterization · Fig. 2 |
| space group | P4/mmm | — | — | Text Exact Reported | 1624 · Synthesis and characterization · Fig. 2 |