cMOF Evidence Base
Diffraction Structure — Microscopic Origin of Electrochemical Capacitance in Metal-Organic Frameworks

Measurement evidence

Diffraction Structure

Microscopic Origin of Electrochemical Capacitance in Metal-Organic Frameworks · Shin S.-J., Gittins J.W., Golomb M.J. et al. · Journal of the American Chemical Society · 2023 · 14529-14538

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

High-resolution synchrotron XRD/PXRD

X-ray diffraction and scattering

Cu3(HHTP)2 powder · Powder

Samples in borosilicate capillaries sealed in N2-filled glovebox; Diamond I11 beamline; wavelength 0.82683 A.

Atmosphere
ambient collection after sealed N2-loaded capillary preparation
Geometry
capillary XRD, Mythen II PSD detector
Context
pristine Cu3(HHTP)2 powder
Measurement source
14535 · Materials Characterization · Supplementary Figure 5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3(HHTP)2 phase assignment by PXRDexperimental PXRD pattern compared to simulated hexagonal eclipsed (P6/mmm) Cu3(HHTP)2——Caption
Qualitative		6 · Supplementary Fig. 5 · Supplementary Figure 5