Powder X-ray diffraction and Scherrer crystallite-size analysis
NiHAB powder · Powder
Bruker D8 Advance with Cu Kalpha source; shape factor 0.9; tallest peak at 7.754 degrees 2theta with fwhm 0.597054 degrees 2theta.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PXRD FWHM used for Scherrer analysis | fwhm = 0.597054 in 2theta | — | — | Text Exact Reported | 15923 · Methods, Powder X-ray Diffraction |
| Phase purity confirmation | phase purity was confirmed by XRD | — | — | Text Qualitative | 15923 · Methods, Electrode Fabrication Procedure · Figure S1 |
| Tallest PXRD peak position used for Scherrer analysis | 7.754 in 2theta | — | — | Text Exact Reported | 15923 · Methods, Powder X-ray Diffraction |
| Estimated crystallite size from Scherrer equation | 31 nm | — | — | Text Rounded Reported | 15923 · Methods, Powder X-ray Diffraction · Figure S1 |
| Average particle size by XRD peak broadening | approximately 30 nm | — | — | Text Approximate | 15922 · Surface vs Bulk Pseudocapacitance in NiHAB · Figure S5 |