cMOF Evidence Base
Diffraction Structure — Dissecting π-conjugated covalent-coupling over conductive MOFs toward efficient two-electron oxygen reduction

Measurement evidence

Diffraction Structure

Dissecting π-conjugated covalent-coupling over conductive MOFs toward efficient two-electron oxygen reduction · Sun X., Li Y., Su H. et al. · Applied Catalysis B: Environmental · 2022 · 121706

3 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (XRD), Cu Kalpha radiation

X-ray diffraction and scattering

Cu-HHTP nanorod powder · Powder

2theta range 3-40 deg; Philips X'Pert Pro Super diffractometer; compared with Ni-HITP and Cu-HITP.

Geometry
Powder diffraction
Context
target pristine conductive MOF
Measurement source
3 · 3.1 Morphology and structure characterization · Fig. 1a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
XRD [001] peak28.1 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [100] peak4.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [200] peak9.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [210] peak12.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a

Powder X-ray diffraction (XRD), Cu Kalpha radiation

X-ray diffraction and scattering

Cu-HITP powder · Powder

2theta range 3-40 deg; Philips X'Pert Pro Super diffractometer; compared with Ni-HITP and Cu-HHTP.

Geometry
Powder diffraction
Context
pristine conductive MOF control
Measurement source
3 · Figure 1 caption · Fig. 1a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
XRD [001] peak28.1 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [100] peak4.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [200] peak9.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [210] peak12.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a

Powder X-ray diffraction (XRD), Cu Kalpha radiation

X-ray diffraction and scattering

Ni-HITP black powder · Powder

2theta range 3-40 deg; Philips X'Pert Pro Super diffractometer; compared with Cu-HITP and Cu-HHTP.

Geometry
Powder diffraction
Context
pristine conductive MOF control
Measurement source
Materials characterizations · Fig. 1a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
XRD [001] peak28.1 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [100] peak4.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [200] peak9.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a
XRD [210] peak12.7 deg 2theta——Text
Rounded Reported		2 · 3.1 Morphology and structure characterization · Fig. 1a