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1 papers
Wojciechowski M., Hovorova K. · Acta IMEKO · 2024
Reported here: anonymous semiconductor material sample shown in Figure 7
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| Paper and reported name | Formula and components | Structure context | Source |
|---|---|---|---|
| anonymous semiconductor material sample shown in Figure 72024 · The development of measuring setup for electrical noise research in two-dimensional semiconductor structures for quantum Hall resistance standard | Not specified | unknown · UnknownUnspecified semiconductor sample used to demonstrate broadband noise screening; identity and framework status are not disclosed. | p006 · 3. Testing the broadband electrical noise measurement setup · Figure 7 |