Device EIS before and after stability testing
Asymmetric Cu3(HHTP)2//AC hybrid device · Electrode
Nyquist plots before and after 1000-cycle stability test; ESR tabulated.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Device ESR after stability test | 0.35 ohm | 0.35 ohm | — | Table Exact Reported | main p.5 · Table 1 · Table 1; Fig. 6c |
| Device ESR before stability test | 0.3 ohm | 0.3 ohm | — | Table Exact Reported | main p.5 · Table 1 · Table 1; Fig. 6b |