Microscopy Morphology — From 2D to 3D: Postsynthetic Pillar Insertion in Electrically Conductive MOF

Measurement evidence

Microscopy Morphology

From 2D to 3D: Postsynthetic Pillar Insertion in Electrically Conductive MOF · Choi J.Y., Flood J., Stodolka M. et al. · ACS Nano · 2022 · 3145-3151

2 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Scanning electron microscopy

Scanning electron microscopy

Cu-THQ-BPY, Cu2+:BPY feed ratio 1:1 · Powder

FE-SEM on JEOL JSM-7401F at 5 kV; compared Cu-THQ and BPY feed-ratio products.

Geometry: Powder nanocrystals
Context: Pristine Cu-THQ and pillared Cu-THQ-BPY series.
Measurement source: main p.3 · Results and Discussion · Figure 2; Figure S7

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Average rod-like nanocrystal size, BPY 1:1	551 nm	—	—	Text Rounded Reported	main p.3 · Results and Discussion · Figure S7
Average rod-like nanocrystal size, BPY 1:2	670 nm	—	—	Text Rounded Reported	main p.3 · Results and Discussion · Figure S7
Average rod-like nanocrystal size, BPY 2:1	336 nm	—	—	Text Rounded Reported	main p.3 · Results and Discussion · Figure S7
Average rod-like nanocrystal size, Cu-THQ	59 nm	—	—	Text Rounded Reported	main p.3 · Results and Discussion · Figure S7

HRTEM and FFT analysis

Transmission electron microscopy

Cu-THQ-BPY, Cu2+:BPY feed ratio 2:1 · Powder

TEM on Titan Themis GT 300 at 300 kV; [101] view of Cu-THQ-BPY.

Geometry: TEM sample
Context: Pillared Cu-THQ-BPY.
Measurement source: main p.3 · Results and Discussion · Figure 2c-d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
FFT lattice-fringe interlayer distance	approximately 7.96 Angstrom	—	—	Text Approximate	main p.3 · Results and Discussion · Figure 2d