SEM, HR-TEM and AFM
Cu3(TABTO)2-Ar powder · Powder
Morphology of pristine and iodine-doped Cu3(TABTO)2-Ar; AFM on Si/SiO2 in air; HR-TEM at 200 kV.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM iodine-doped flake thickness | 3.5 nm | — | — | Text Exact Reported | 18350 · Results and Discussion · Figure S17 |
| AFM pristine flake thickness | 3.0 nm | — | — | Text Exact Reported | 18350 · Results and Discussion · Figure S17 |
| SEM particle size description | bulk particles with sizes of several micrometers | — | — | Text Qualitative | 18350 · Results and Discussion · Figure S15 |
| Iodine-doped HR-TEM repeat distance | about 0.58 nm | — | about | Text Approximate | 18350 · Results and Discussion · Figure S16c,d |
| Pristine HR-TEM interlayer distance | ~0.33 nm | — | ~ | Text Approximate | 18350 · Results and Discussion · Figure S16a,b |