Diffraction Structure — Humidity-Mediated Dual Ionic-Electronic Conductivity Enables High Sensitivity in MOF Chemiresistors

Measurement evidence

Diffraction Structure

Humidity-Mediated Dual Ionic-Electronic Conductivity Enables High Sensitivity in MOF Chemiresistors · Jo Y.-M., Kim D.-H., Wang J. et al. · Journal of the American Chemical Society · 2024 · 20213-20220

3 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD and SEM characterization of control cMOFs

M3HHTP2 and M3HITP2 control sensors · Electrode

PXRD spectra and SEM images for M3HHTP2 and M3HITP2 (M = Co, Ni, Cu).

Context
pristine control frameworks
Measurement source
p011-p012 / SI pp.11-12 · Section S3 Characterization · Figures S4 and S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Continuous humidity-dependent PXRD

Cu3HHTT2 powder · Powder

PANalytical Empyrean Mo Kalpha with Anton Paar CHC+ heating/humidity stage; powders pre-activated at 80 C under dry air; spectra after 90 min humidity saturation; scan speed 4.5 deg/min.

Atmosphere
controlled humidity dry to 80% RH
Context
pristine target framework
Measurement source
p004 / SI p.4 · S1.2 Methods · Figures 3c,d and S8
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Low-humidity (001) peak position before shift25.52 degrees at low humidity (1-25% RH), shifting lower at 30-80% RHText
Exact Reported
p003 / article p.20215 · Results and Discussion · Figure 3d
Hydrated/dehydrated (100) peak position3.72 degreesText
Exact Reported
p003 / article p.20215 · Results and Discussion · Figure 3c

Laboratory powder X-ray diffraction

Cu3HHTT2 powder · Powder

Reflection mode Bruker Advance II with Ni-filtered Cu Kalpha radiation; sample on zero-background silicon substrate; scan speed 2 deg min-1.

Context
pristine target framework
Measurement source
p004 / SI p.4 · S1.2 Methods
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3HHTT2 PXRD (100) peak position3.91 degrees 2thetaText
Exact Reported
p002 / article p.20214 · Results and Discussion · Figure 1b
Cu3HHTT2 PXRD (200) peak position7.93 degrees 2thetaText
Exact Reported
p002 / article p.20214 · Results and Discussion · Figure 1b