Microscopy Morphology — Humidity-Mediated Dual Ionic-Electronic Conductivity Enables High Sensitivity in MOF Chemiresistors

Measurement evidence

Microscopy Morphology

Humidity-Mediated Dual Ionic-Electronic Conductivity Enables High Sensitivity in MOF Chemiresistors · Jo Y.-M., Kim D.-H., Wang J. et al. · Journal of the American Chemical Society · 2024 · 20213-20220

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Scanning electron microscopy

Cu3HHTT2 powder · Powder

Zeiss Gemini 450 high-resolution SEM with InLens or SE2 signal at 3.00 kV.

Context: pristine target framework
Measurement source: p004 / SI p.4 · S1.2 Methods · Figure S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3HHTT2 morphology	hexagonal nanorods	—	—	Text Qualitative	p002 / article p.20214 · Results and Discussion · Figure S2