cMOF Evidence Base
Diffraction Structure — Conductive MOFs with tailored polarization loss for broadband absorption at ultrathin thickness

Measurement evidence

Diffraction Structure

Conductive MOFs with tailored polarization loss for broadband absorption at ultrathin thickness · Zhang W., Luo J., Shi J. et al. · Nano Research · 2025 · 94907919

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction with Cu Kalpha radiation

X-ray diffraction and scattering

CuM-HHTP sample set · Powder

PANALYTICAL X'Pert3 Powder diffractometer; all six CuM-HHTP samples.

Context
pristine bimetallic conductive MOF powders
Measurement source
2-3 · 3.1 · Fig. 1(b)
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
detectable impurity phasesNo detectable impurity phases——Qualitative
Qualitative		2 · 3.1 · Fig. 1(b)
XRD peak assigned to (002)27.6 degrees——Text
Rounded Reported		2 · 3.1 · Fig. 1(b)
XRD peak assigned to (200)9.5 degrees——Text
Rounded Reported		2 · 3.1 · Fig. 1(b)
XRD peak assigned to (201)12.7 degrees——Text
Rounded Reported		2 · 3.1 · Fig. 1(b)