cMOF Evidence Base
Diffraction Structure — Conductive metal organic framework for ion-selective membrane-free solid-contact potentiometric Cu2+ sensing

Measurement evidence

Diffraction Structure

Conductive metal organic framework for ion-selective membrane-free solid-contact potentiometric Cu2+ sensing · Xu L., Gan S., Zhong L. et al. · Journal of Electroanalytical Chemistry · 2022 · 115923

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, TEM, EDS mapping, and powder XRD

X-ray diffraction and scatteringScanning electron microscopyTransmission electron microscopyElemental microanalysis and mapping

As-synthesised Cu3(HHTP)2 black powder · Powder

SEM/TEM/EDS used to assess morphology and elemental distribution; XRD compared with prior Cu3(HHTP)2 patterns.

Context
pristine Cu3(HHTP)2 powder
Measurement source
p003 · 3.1 Structural compositions and electrochemical redox · Fig. 1; Figure S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EDS elemental distributionC, O and Cu elements uniformly distributed throughout Cu3(HHTP)2——Text
Qualitative		p002-p003 · 3.1 Structural compositions and electrochemical redox · Fig. 1d-f; Figure S1a
SEM morphologyuniform nanoscale polyhedron morphology——Text
Qualitative		p002-p003 · 3.1 Structural compositions and electrochemical redox · Fig. 1a
TEM morphologyrod-shape / uniform rod crystal structure——Text
Qualitative		p002-p003 · 3.1 Structural compositions and electrochemical redox · Fig. 1b; Figure S1b-c
XRD phase assignmentsharp diffraction peaks in accordance with previously reported Cu3(HHTP)2 XRD patterns——Text
Qualitative		p002-p003 · 3.1 Structural compositions and electrochemical redox · Fig. 1c