Measurement evidence
Isoreticular Linker Substitution in Conductive Metal–Organic Frameworks with Through-Space Transport Pathways · Xie L.S., Park S.S., Chmielewski M.J. et al. · Angewandte Chemie - International Edition · 2020 · 19623-19626
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Cd cobaltocene-treated powder · Powder
cobaltocene-treated Cd measured under nitrogen at 302 K
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cd Cp2Co-treated conductivity | < 1 x 10-11 | — | — | SI Table Range | S49 · Attempted doping of MOFs with chemical oxidants and reductants · Table S13 |
Cd iodine-solution-treated powder · Powder
I2/toluene-treated Cd measured after 100 degrees C treatment
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cd I2-solution-treated conductivity | 5.2 x 10-10 | — | — | SI Table Exact Reported | S49 · Attempted doping of MOFs with chemical oxidants and reductants · Table S13 |
Cd iodine-vapour-treated powder · Powder
I2-vapour-treated Cd measured after 32 days
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cd I2-vapour-treated conductivity | 2.2 x 10-11 | — | — | SI Table Exact Reported | S49 · Attempted doping of MOFs with chemical oxidants and reductants · Table S13 |
Cd NOBF4-treated powder · Powder
NOBF4-treated Cd measured under nitrogen at 302 K
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cd NOBF4-treated conductivity | < 1 x 10-11 | — | — | SI Table Range | S49 · Attempted doping of MOFs with chemical oxidants and reductants · Table S13 |
Cd two-contact pressed pellet · Pellet
home-built two-probe in situ press; powder under approximately 200 MPa
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| pressed-pellet conductivity batch 1 | 1.6e-11 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S12 |
| pressed-pellet conductivity batch 2 | 3e-12 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S12 |
| pressed-pellet conductivity batch 3 | 1.5e-11 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S12 |
Cd diffraction-quality/single-crystal device crystals · Single Crystal
I-V sweep with Keithley 2450; crystal contacted along c crystallographic axis
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| average single-crystal conductivity along stacking direction | 6 x 10-7 | — | — | SI Table Rounded Reported | S41 · Physical Characterization · Table S9 |
| champion single-crystal conductivityMarked as a best value within this paper | 2.7 x 10-6 | — | — | Text Exact Reported | p003 · Results · Tables S7 and S8 |
| single-crystal conductivity batch 1 device 1Marked as a best value within this paper | 2.7e-06 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
| single-crystal conductivity batch 1 device 2 | 1.5e-06 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
| single-crystal conductivity batch 1 device 3 | 7.8e-07 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
| single-crystal conductivity batch 2 device 1 | 1.2e-08 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
| single-crystal conductivity batch 2 device 2 | 1.1e-08 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
| single-crystal conductivity batch 2 device 3 | 9.3e-09 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
| single-crystal conductivity batch 3 device 1 | 2.4e-09 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
| single-crystal conductivity batch 3 device 2 | 1.3e-09 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S8 |
Cd TCNE-treated powder · Powder
TCNE-treated Cd measured after workup
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cd TCNE-treated conductivity | 5.5 x 10-10 | — | — | SI Table Exact Reported | S49 · Attempted doping of MOFs with chemical oxidants and reductants · Table S13 |
Mn iodine-vapour-treated powder · Powder
I2-vapour-treated Mn measured after 32 days
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Mn I2-vapour-treated conductivity | 4.4 x 10-9 | — | — | SI Table Exact Reported | S49 · Attempted doping of MOFs with chemical oxidants and reductants · Table S13 |
Mn two-contact pressed pellet · Pellet
home-built two-probe in situ press; powder under approximately 200 MPa
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| pressed-pellet conductivity batch 1 | 4e-09 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S10 |
| pressed-pellet conductivity batch 2 | 2e-12 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S10 |
| pressed-pellet conductivity batch 3 | 1.2e-11 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S10 |
| typical pressed-pellet conductivity summary | < 10-10 for Mn, Zn, and Cd | — | — | Text Range | p003 · Results · Tables S10-S12; Figure S23 |
Mn diffraction-quality/single-crystal device crystals · Single Crystal
I-V sweep with Keithley 2450; crystal contacted along c crystallographic axis
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| average single-crystal conductivity along stacking direction | 8 x 10-8 | — | — | SI Table Rounded Reported | S41 · Physical Characterization · Table S9 |
| champion single-crystal conductivityMarked as a best value within this paper | 2.0 x 10-7 | — | — | Text Exact Reported | p003 · Results · Tables S7 and S8 |
| single-crystal conductivity batch 1 device 1Marked as a best value within this paper | 2e-07 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S7 |
| single-crystal conductivity batch 1 device 2 | 1.5e-07 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S7 |
| single-crystal conductivity batch 2 device 1 | 2.7e-08 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S7 |
| single-crystal conductivity batch 2 device 2 | 2.6e-08 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S7 |
| single-crystal conductivity batch 3 device 1 | 2.1e-09 | — | — | SI Table Exact Reported | S40 · Physical Characterization · Table S7 |
Zn two-contact pressed pellet · Pellet
home-built two-probe in situ press; powder under approximately 200 MPa
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| pressed-pellet conductivity batch 1 | 5e-12 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S11 |
| pressed-pellet conductivity batch 2 | 6.9e-11 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S11 |
| pressed-pellet conductivity batch 3Marked as a best value within this paper | 1.6e-10 | — | — | SI Table Exact Reported | S42 · Physical Characterization · Table S11 |