Spectroscopy — From n- To p-Type Material: Effect of Metal Ion on Charge Transport in Metal-Organic Materials

Measurement evidence

Spectroscopy

From n- To p-Type Material: Effect of Metal Ion on Charge Transport in Metal-Organic Materials · Yoon S., Talin A.A., Stavila V. et al. · ACS Applied Materials and Interfaces · 2021 · 52055-52062

2 measurement groups · 16 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Elemental analysis, EDX, and XPS surface atomic ratios.

a-Pt-HITP powder · Powder

EA for C/H/N/O, photometric metal content, chloride titration, EDX, and XPS.

Geometry
XPS under 1e-10 Torr with Al K-alpha source.
Context
target_sample_with_controls
Measurement source
p002-p004 · Characterization; Results · Table 1; Tables S1-S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Pd-HITP elemental-analysis metal mass percent21.2%SI Table
Exact Reported
p004 · EDXS & EA data · Table S1
Pt-HITP elemental-analysis metal mass percent41%SI Table
Exact Reported
p004 · EDXS & EA data · Table S1
Pd-HITP EDX atomic ratio C:N:Pd:O:Cl26.2:10.6:1.0:3.0:0.5Text
Exact Reported
p003 · a-Pd-HITP powder
Pt-HITP EDX atomic ratio C:N:Pt:O:Cl15.2:5.0:1.0:2.3:0.18Text
Exact Reported
p002 · Syntheses
a-Pt-HITP normalised formulaPt3(C18H12N6)2.2Cl1.7*5(H2O)Text
Rounded Reported
p003 · Results · Table 1
Ni-HITP N:M ratio3.79 (HITP:M 0.67)Table
Exact Reported
p003 · Results · Table 1
Pt-HITP C:M ratio13.2 (HITP:M 0.73)Table
Exact Reported
p003 · Results · Table 1
Pt-HITP N:M ratio4.4 (HITP:M 0.73)Table
Exact Reported
p003 · Results · Table 1
Pt oxidation state by XPS+2 oxidation state; no evidence of Pt4+Text
Qualitative
p004 · Results · Figure 1e
Pt-HITP XPS surface Cl atomic percent3.5%SI Table
Exact Reported
p004 · EDXS & EA data · Table S2
Pt-HITP XPS surface Pt atomic percent2.0%SI Table
Exact Reported
p004 · EDXS & EA data · Table S2

Raman spectroscopy at 532 nm.

a-Pt-HITP powder · Powder

20 scans per sample, 50x objective, 100 mW/cm2 laser power.

Geometry
Renishaw inVia Raman Microscope.
Context
target_sample_with_control
Measurement source
p002-p004 · Characterization; Raman Spectroscopy · Figure 1f; Table 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Crystalline Ni-HITP Raman 1300-1500 cm-1 relative intensity1300-1500 cm-1; relative intensity 0.62frequency range 1300-1500 cm-1Table
Range
p004 · Raman Spectroscopy · Table 2
Crystalline Ni-HITP Raman 600-800 cm-1 relative intensity600-800 cm-1; relative intensity 0.10frequency range 600-800 cm-1Table
Range
p004 · Raman Spectroscopy · Table 2
a-Pt-HITP Raman 1300-1500 cm-1 relative intensity1300-1500 cm-1; relative intensity 0.32frequency range 1300-1500 cm-1Table
Range
p004 · Raman Spectroscopy · Table 2
a-Pt-HITP Raman 600-800 cm-1 relative intensity600-800 cm-1; relative intensity 0.04frequency range 600-800 cm-1Table
Range
p004 · Raman Spectroscopy · Table 2
Raman low/high intensity ratio changedecreased from 0.16 to 0.13 comparing Ni-HITP to a-Pt-HITPText
Rounded Reported
p004 · Raman Spectroscopy · Table 2