powder X-ray diffraction
microcrystalline sample of complex 1 · Powder
Bruker Advance II, Cu Kalpha radiation, 40 kV/40 mA, 2 steps per second; thin layer on zero-background silicon plate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| complex 1 PXRD impurity assessment | absence of impurity peaks; qualitative similarity to simulated pattern | — | — | Text Qualitative | S10 · Figure S7a |