Scanning electron microscopy (SEM)
Ni-PTC nanorod dark powder · Powder
Hitachi S4800-SEM at 5 kV; samples on conductive silicon substrates and coated with platinum thin film.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Nanorod length upper bound | 500 nm to 5 um length | 5 um | range | Text Range | 3 · Synthesis and structural characterizations · Fig. S4 |
| Nanorod length lower bound | 500 nm to 5 um length | 0.5 um | range | Text Range | 3 · Synthesis and structural characterizations · Fig. S4 |
| Nanorod width range | 50 nm to more than 200 nm in width | — | 50 to >200 nm | Text Range | 3 · Synthesis and structural characterizations · Fig. S4 |