Optical microscopy and atomic force microscopy
Wild-type reflectin A1 thin film on SiO2/Si with gold electrodes · Thin Film
Optical images used for length/width; AFM trenches used for film thickness at dry and humidified relative humidities.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM morphology | films are smooth and featureless over large areas | — | — | Caption Qualitative | 14 · Supplementary Figure 4 caption · Supplementary Figure 4 |
| Reflectin film thickness increase from dry to 90% RH | ~40% | — | — | Text Approximate | 5 · Atomic Force Microscopy |