Electrical Transport — Exploration of semiconducting properties of Zn(ii)- And Cd(ii)-based coordination polymers with dicarboxylate of a chair-type backbone

Measurement evidence

Electrical Transport

Exploration of semiconducting properties of Zn(ii)- And Cd(ii)-based coordination polymers with dicarboxylate of a chair-type backbone · Akhtaruzzaman, Pal B., Khan S. et al. · CrystEngComm · 2021 · 7525-7533

3 measurement groups · 26 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

two-probe capacitance versus frequency measurement

Al/CP 1/ITO Schottky diode film · Electrode

Capacitance at saturation used to calculate dielectric constants for CP 1 and CP 2.

Atmosphere
ambient/not specified
Geometry
Al/compound/ITO diode structures
Context
pristine CP layers in device stacks
Measurement source
7531 · Analysis of diode parameters · Figure S11
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CP 1 dielectric constant12.37Text
Exact Reported
7531 · Analysis of diode parameters · Figure S11
CP 2 dielectric constant4.87Text
Exact Reported
7531 · Analysis of diode parameters · Figure S11

current-voltage (I-V/J-V) measurement and Cheung thermionic-emission analysis

Al/CP 1/ITO Schottky diode film · Electrode

+/- 1 V dc bias at room temperature (300 K) on fabricated Al/CP 1/ITO device; Cheung dV/dlnJ vs J and H(J) vs J fits.

Temperature
300
Atmosphere
ambient/not specified
Geometry
Al/CP 1/ITO metal-semiconductor diode; CP film thickness 1 um; contact area 7.065 x 10^-6 m2
Context
pristine CP layer in device stack
Measurement source
7529 · Electrical studies · Figures 5-7; Tables 1-2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CP 1 Schottky barrier height0.59 eVTable
Exact Reported
7530 · Electrical studies · Table 1
CP 1 ohmic conductivityMarked as a best value within this paper7.51 x 10^-4 S m^-10.000751 S m^-1Table
Exact Reported
7530 · Electrical studies · Table 1
CP 1 ideality factor1.27Table
Exact Reported
7530 · Electrical studies · Table 1
CP 1 current density at +1 Vapproximately 2000 A/m2 from Fig. 52000 A m^-2visual estimate from plotted axisFigure Axis
Approximate
7529 · Electrical studies · Figure 5
CP 1 effective carrier mobilityMarked as a best value within this paper1.58 x 10^-5 m2 V^-1 s^-10.0000158 m2 V^-1 s^-1Table
Exact Reported
7530 · Electrical studies · Table 2
CP 1 mobility-transit time product6.67 x 10^-13 m2 V^-16.67e-13 m2 V^-1Table
Exact Reported
7530 · Electrical studies · Table 2
CP 1 rectification ratioMarked as a best value within this paper23.19Table
Exact Reported
7530 · Electrical studies · Table 1
CP 1 lnJ-lnV Region I slopeslope 1.16Figure Axis
Approximate
7530 · Electrical studies · Figure 7a
CP 1 lnJ-lnV Region II slopeslope 2.31Figure Axis
Approximate
7530 · Electrical studies · Figure 7a
CP 1 series resistance from dV/dlnJ vs J0.15 KOhm150 OhmTable
Exact Reported
7530 · Electrical studies · Table 1
CP 1 transit time4.22 x 10^-8 s4.22e-8 sTable
Exact Reported
7530 · Electrical studies · Table 2
effective Schottky contact area7.065 x 10^-6 m20.000007065 m2Text
Exact Reported
7527 · Device fabrication
CP device film thickness1 um0.000001 mText
Exact Reported
7527 · Device fabrication

current-voltage (I-V/J-V) measurement and Cheung thermionic-emission analysis

Al/CP 2/ITO Schottky diode film · Electrode

+/- 1 V dc bias at room temperature (300 K) on fabricated Al/CP 2/ITO device; Cheung dV/dlnJ vs J and H(J) vs J fits.

Temperature
300
Atmosphere
ambient/not specified
Geometry
Al/CP 2/ITO metal-semiconductor diode; CP film thickness 1 um; contact area 7.065 x 10^-6 m2
Context
pristine CP layer in device stack
Measurement source
7529 · Electrical studies · Figures 5-7; Tables 1-2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CP 2 Schottky barrier height0.64 eVTable
Exact Reported
7530 · Electrical studies · Table 1
CP 2 ohmic conductivity2.52 x 10^-4 S m^-10.000252 S m^-1Table
Exact Reported
7530 · Electrical studies · Table 1
CP 2 ideality factor0.32Table
Exact Reported
7530 · Electrical studies · Table 1
CP 2 current density at +1 Vapproximately 550 A/m2 from Fig. 5550 A m^-2visual estimate from plotted axisFigure Axis
Approximate
7529 · Electrical studies · Figure 5
CP 2 effective carrier mobility1.1 x 10^-5 m2 V^-1 s^-10.000011 m2 V^-1 s^-1Table
Exact Reported
7530 · Electrical studies · Table 2
CP 2 mobility-transit time product6.93 x 10^-13 m2 V^-16.93e-13 m2 V^-1Table
Exact Reported
7530 · Electrical studies · Table 2
CP 2 rectification ratio10.76Table
Exact Reported
7530 · Electrical studies · Table 1
CP 2 lnJ-lnV Region I slopeslope 0.96Figure Axis
Approximate
7530 · Electrical studies · Figure 7a
CP 2 lnJ-lnV Region II slopeslope 1.89Figure Axis
Approximate
7530 · Electrical studies · Figure 7a
CP 2 series resistance from dV/dlnJ vs J0.56 KOhm560 OhmTable
Exact Reported
7530 · Electrical studies · Table 1
CP 2 transit time6.3 x 10^-8 s6.3e-8 sTable
Exact Reported
7530 · Electrical studies · Table 2