Atomic force microscopy (AFM)
large-area Cu3BHT film on fused silica · Thin Film
AFM image of Cu3BHT film on fused silica; thickness measured with Bruker Multimode 8 HR per SI.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu3BHT film thickness | ~20 nm | — | — | Text Approximate | 2 · Synthesis and characterization · Fig. 1c; Supplementary Fig. 1 |
| Root mean square roughness | 1.3 nm | — | — | Text Rounded Reported | 2 · Synthesis and characterization · Fig. 1c |