SEM, TEM, AFM and HAADF-STEM/EDS
Scanning electron microscopyTransmission electron microscopyAtomic force microscopyElemental microanalysis and mapping
Vg-Por(Co)-MOF(9:1) · Powder
Morphology and elemental mapping of Vg-Por(Co)-MOF(9:1); family SEM/TEM/AFM in SI.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM thickness | about 2.5 nm | — | — | Figure Axis Approximate | p004 / article 8742 · Results and discussion · Fig. 2c |
| ultrasonicated nanosheet thickness range | between 1 and 4 nm | — | — | Text Range | p003 / article 8741 · Results and discussion · Fig. S22 |