Electrical Transport — Morphological control of a metal-organic framework for single-crystal electronic device fabrication

Measurement evidence

Electrical Transport

Morphological control of a metal-organic framework for single-crystal electronic device fabrication · Wang Y., Miao X., Sun L. · CrystEngComm · 2025 · 5848-5854

4 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

single-crystal DC I-V conductivity measurement

H4TTFTB single crystals · Single Crystal

10 H4TTFTB crystals measured; representative I-V and conductivity distribution reported in Fig. S15

Atmosphere
not fully stated; compared to ambient single-crystal conditions
Geometry
single-crystal electronic devices
Context
H4TTFTB molecular crystal
Measurement source
5 · Single-crystal electrical conductivity measurements · Fig. S15
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
H4TTFTB average single-crystal DC electrical conductivity3.08 x 10^-6 S cm^-1Text
Exact Reported
5 · Single-crystal electrical conductivity measurements · Fig. S15

two-contact DC I-V conductivity measurement

Zn-9 two-contact single-crystal electronic device · Electrode

Voltage scanned -0.1 to 0.1 V in 1 mV steps using Keithley 2636B; 15 devices

Temperature
298
Atmosphere
humid air, 38-45% relative humidity
Geometry
manual two-contact probe device; current along crystallographic c axis
Context
pristine Zn2(TTFTB) active crystal
Measurement source
4-6 · Single-crystal electrical conductivity measurements; DC I-V characterization · Fig. 6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
previously reported comparable Zn2(TTFTB) conductivity3.95 x 10^-6 S cm^-1 under similar conditionsText
Exact Reported
4 · Single-crystal electrical conductivity measurements
representative Zn-9 I-V current at +0.1 Vapproximately +1.0 nA at +0.1 V from Fig. 6b axisFigure Axis
Approximate
4 · Single-crystal electrical conductivity measurements · Fig. 6b
Zn-9 I-V contact behaviourOhmic contact with linear current-voltage curvesText
Qualitative
4 · Single-crystal electrical conductivity measurements · Fig. 6b
Zn-9 average single-crystal DC electrical conductivityMarked as a best value within this paper3.84 x 10^-6 S cm^-1Text
Exact Reported
4 · Single-crystal electrical conductivity measurements · Fig. 6c

pressed-pellet DC I-V conductivity measurement

pressed pellet of Zn-9 · Pellet

Home-built pressed pellet instrument; 0.3 cm diameter, 0.31 cm thickness; Keithley 4200A-SCS; I-V at 297 K

Temperature
297
Atmosphere
air, 40% relative humidity
Geometry
pressed pellet between stainless-steel rods
Context
pristine Zn2(TTFTB) pellet
Measurement source
6,20 · Measurements on pressed pellets of Zn-9 · Figure S14
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Zn-9 pellet diameter0.3 cmText
Exact Reported
6 · Measurements on pressed pellets of Zn-9
Zn-9 pellet thickness0.31 cmText
Exact Reported
6 · Measurements on pressed pellets of Zn-9
Zn-9 pressed-pellet DC electrical conductivity4.29 x 10^-7 S cm^-1Text
Exact Reported
5 · Single-crystal electrical conductivity measurements · Fig. S14

micro/nano-fabricated device attempt

Zn-3 micro/nano-fabricated single-crystal device attempt · Electrode

Zn-3 suspended in ethanol, spin coated on silicon wafer; Ti/Au electrodes by e-beam lithography and sputtering

Atmosphere
not stated
Geometry
silicon wafer with Ti/Au markers and 5 nm Ti/200 nm Au electrodes
Context
pristine Zn2(TTFTB) active crystal with device contacts
Measurement source
6,11 · Micro/nano fabrication of single-crystal electronic devices · Figure S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Zn-3 micro/nano device outcomedid not yield working devices due to crystal cracking and bad crystal-electrode contactText
Qualitative
3 · Attempts to grow thin crystals for micro/nano fabrication · Fig. S5