Field emission scanning electron microscopy
ITO/complex 1/Al thin-film Schottky device · Thin Film
Thin film morphology; Fig. 4 instrument metadata in image shows 15.00 kV, 30.00 KX magnification and 200 nm scale bar.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| complex 1 thin-film morphology | randomly oriented flakes with individual coarse islands; porous morphology with shallow cavities; grain size not measurable due to agglomeration | — | — | Text Qualitative | p005-p006 · 3.5 Morphological analysis · Fig. 4a |