SEM-EDX elemental analysis
Scanning electron microscopyElemental microanalysis and mappingBulk elemental and compositional analysis
La-ONDI-DMA single crystals · Single Crystal
Leo Gemini SEM; Oxford Instruments Model 7426 EDX at 20 kV; KCl and LaB6 standards.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| La-ONDI EDX average Cl atomic percentage | 44.87 atomic % | — | — | SI Table Exact Reported | 3 · Table S2 · Table S2 |
| La-ONDI EDX average La atomic percentage | 55.13 atomic % | — | — | SI Table Exact Reported | 3 · Table S2 · Table S2 |