Diffraction Structure — Isoreticular Modulation of Electrical Conduction and Magnetic Properties in Semiconducting Lanthanide-based Based Metal−Organic Frameworks

Measurement evidence

Diffraction Structure

Isoreticular Modulation of Electrical Conduction and Magnetic Properties in Semiconducting Lanthanide-based Based Metal−Organic Frameworks · Qing H., Diamond B.G., Chan J.Y.M. et al. · Angewandte Chemie - International Edition · 2026 · e8403106

4 measurement groups · 22 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD, SEM/TEM/HR-TEM, EDS, ATR-IR, XPS and elemental analysis

Infrared spectroscopy X-ray photoelectron spectroscopy X-ray diffraction and scattering Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping Bulk elemental and compositional analysis

Eu-HHTP powder · Powder

Measurement source: 3 · Synthesis and Structural Analysis

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HR-TEM lattice periodicity along one direction	1.88 nm	—	—	Text Exact Reported	4 · Synthesis and Structural Analysis
elemental-analysis lanthanide weight content	28.67 wt%	—	—	SI Table Exact Reported	24 · Elemental Analysis
calculated metal-to-ligand ratio	1.3	—	—	SI Table Exact Reported	24 · Elemental Analysis
PXRD Rietveld goodness of fit	2.39	—	—	Figure Axis Rounded Reported	20 · XRD Refinement
PXRD Rietveld Rwp	1.18 %	—	—	Figure Axis Rounded Reported	20 · XRD Refinement
modelled honeycomb pore size	about 1.9 nm	—	—	Text Exact Reported	4 · Synthesis and Structural Analysis
secondary FFT reflection spacing	about 0.31 nm at about 90 deg	—	—	Text Exact Reported	4 · Synthesis and Structural Analysis

PXRD, SEM/TEM/HR-TEM, EDS, ATR-IR, XPS and elemental analysis

Infrared spectroscopy X-ray photoelectron spectroscopy X-ray diffraction and scattering Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping Bulk elemental and compositional analysis

Gd-HHTP powder · Powder

Measurement source: 3 · Synthesis and Structural Analysis

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HR-TEM lattice periodicity along one direction	1.87 nm	—	—	Text Exact Reported	4 · Synthesis and Structural Analysis
elemental-analysis lanthanide weight content	28.64 wt%	—	—	SI Table Exact Reported	24 · Elemental Analysis
calculated metal-to-ligand ratio	1.2	—	—	SI Table Exact Reported	24 · Elemental Analysis
PXRD Rietveld goodness of fit	2.08	—	—	Figure Axis Rounded Reported	20 · XRD Refinement
PXRD Rietveld Rwp	1.09 %	—	—	Figure Axis Rounded Reported	20 · XRD Refinement

PXRD, SEM/TEM/HR-TEM, EDS, ATR-IR, XPS and elemental analysis

Infrared spectroscopy X-ray photoelectron spectroscopy X-ray diffraction and scattering Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping Bulk elemental and compositional analysis

Sm-HHTP powder · Powder

Measurement source: 3 · Synthesis and Structural Analysis

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HR-TEM lattice periodicity along one direction	1.9 nm	—	—	Text Exact Reported	4 · Synthesis and Structural Analysis
elemental-analysis lanthanide weight content	29.79 wt%	—	—	SI Table Exact Reported	24 · Elemental Analysis
calculated metal-to-ligand ratio	1.25	—	—	SI Table Exact Reported	24 · Elemental Analysis
PXRD Rietveld goodness of fit	1.88	—	—	Figure Axis Rounded Reported	20 · XRD Refinement
PXRD Rietveld Rwp	1.41 %	—	—	Figure Axis Rounded Reported	20 · XRD Refinement

PXRD, SEM/TEM/HR-TEM, EDS, ATR-IR, XPS and elemental analysis

Infrared spectroscopy X-ray photoelectron spectroscopy X-ray diffraction and scattering Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping Bulk elemental and compositional analysis

Tb-HHTP powder · Powder

Measurement source: 3 · Synthesis and Structural Analysis

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HR-TEM lattice periodicity along one direction	1.85 nm	—	—	Text Exact Reported	4 · Synthesis and Structural Analysis
elemental-analysis lanthanide weight content	28.38 wt%	—	—	SI Table Exact Reported	24 · Elemental Analysis
calculated metal-to-ligand ratio	1.32	—	—	SI Table Exact Reported	24 · Elemental Analysis
PXRD Rietveld goodness of fit	2.82	—	—	Figure Axis Rounded Reported	20 · XRD Refinement
PXRD Rietveld Rwp	1.35 %	—	—	Figure Axis Rounded Reported	20 · XRD Refinement