Atomic force microscopy
Pristine Ni-HAB EC-MOF thin film on silicon wafer · Thin Film
Surface roughness of as-prepared EC-MOF nanoparticle film.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM average roughness Ra | Ra < 20 nm; Figure S5 label Ra: 14.8 nm | — | — | Figure Axis Rounded Reported | p006 · Supporting Information · Figure S5 |
| AFM root-mean-square roughness Rq | Rq < 20 nm; Figure S5 label Rq: 18.8 nm | — | — | Figure Axis Rounded Reported | p006 · Supporting Information · Figure S5 |