Diffraction Structure — Nano UiO-66 and UiO-66-NH2 MOFs as Bifunctional Electrocatalysts for Water-Splitting: A Comparative Study

Measurement evidence

Diffraction Structure

Nano UiO-66 and UiO-66-NH2 MOFs as Bifunctional Electrocatalysts for Water-Splitting: A Comparative Study · Abbas B., Ravindra A.V. · Molecular Catalysis · 2025 · 115025

4 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder XRD before and after water splitting

U post-water-splitting SI electrode · Electrode

Repeated electrochemical measurements and stability tests followed by XRD to assess framework structural changes; nickel foam pattern also included.

Geometry
paste-coated nickel foam electrode
Context
UiO-66/PVDF/NF post-reaction electrode
Measurement source
1-2 · XRD before and after the water-splitting process · Fig. S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
post-water-splitting XRD framework peak intensity7.3 deg MOF peak observed but intensity significantly decreased for U after electrochemical measurementsText
Qualitative
2 · XRD before and after the water-splitting process · Fig. S1

Powder XRD before and after water splitting

U-N post-water-splitting SI electrode · Electrode

Repeated electrochemical measurements and stability tests followed by XRD to assess framework structural changes; nickel foam pattern also included.

Geometry
paste-coated nickel foam electrode
Context
UiO-66-NH2/PVDF/NF post-reaction electrode
Measurement source
1-2 · XRD before and after the water-splitting process · Fig. S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
post-water-splitting XRD framework peak intensityMarked as a best value within this paper7.3 deg MOF peak observed with nearly consistent intensity for U-N after electrochemical measurementsText
Qualitative
2 · XRD before and after the water-splitting process · Fig. S1

Powder X-ray diffraction (PANalytical Xpert-Pro, Cu K alpha, lambda = 1.5406 A)

UiO-66 powder, labelled U · Powder

2theta range 10-60 deg at room temperature; compared with simulated UiO-66 CIF 4512072.

Context
pristine UiO-66 powder
Measurement source
3 · 2.3 Materials characterization; 3.1 XRD · Fig. 1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
indexed XRD peak positions7.3, 8.5, 12, 17.1, 25.7, 28.1, 30.7, 43.1, 50.2, and 56.3 deg indexed to (111), (200), (220), (400), (442), (533), (551), (771), (971), and (991)Text
Rounded Reported
3-4 · 3.1 XRD · Fig. 1

Powder X-ray diffraction (PANalytical Xpert-Pro, Cu K alpha, lambda = 1.5406 A)

UiO-66-NH2 powder, labelled U-N · Powder

2theta range 10-60 deg at room temperature; compared with simulated UiO-66 CIF 4512072.

Context
pristine amino-functionalised UiO-66-NH2 powder
Measurement source
3-4 · 3.1 XRD · Fig. 1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
amino functionalisation retains UiO phaseIdentical peaks in U and U-N indicate amino groups do not modify the fundamental crystal structure or phase.Text
Qualitative
4 · 3.1 XRD · Fig. 1