Powder X-ray diffraction (XRD), Cu Kalpha radiation
Co-Ni(TPA)-2 · Powder
Compared with Ni(TPA) simulated/standard pattern.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Doped sample phase retention | retained characteristic peaks of Ni(TPA); no secondary phases reported | — | — | Text Qualitative | 350 · 3.1. Characterization of synthesized MOFs · Fig. 1 |