X-ray diffraction, Cu K alpha 1.5408 A, Bruker
0.3 NPC · Powder
XRD pattern of NPC series compared with CdS standard card and Ni-MOF reference pattern.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| NPC XRD low-loading phase visibility | CdS peaks present in NPC series; Ni-MOF and Pt diffraction peaks not clearly observed due to small loading | — | — | Text Qualitative | 3-4 · 3.1 · Fig. S1 |