XRD/SAED/TEM
2D CuCl-TU polymer nanosheet · Nanosheet
Calculated and experimental diffraction used to assign interlayer spacing and weak interlayer interactions.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| TEM curled-edge layer-to-layer distance | 1.06 nm | — | — | Caption Exact Reported | 19 · Figure caption · Figure S15 |
| Calculated interlayer spacing | 1.058 nm | — | — | Text Exact Reported | 3 · Results and Discussion · Figure 2g |