FTIR, PXRD, TEM/HRTEM, SAED, AFM, SEM, Tyndall effect
Infrared spectroscopyX-ray diffraction and scatteringScanning electron microscopyTransmission electron microscopyAtomic force microscopy
CF-2 · Electrode
Structural and morphological characterisation of CF-2, with CF-1/CF-3/CF-4 comparisons in SI
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CF-1 HRTEM lattice spacing | 0.40 nm | — | — | Caption Exact Reported | S-13 · 6. Figures · Figure S14 |
| CF-2 HRTEM lattice spacing | 0.44 nm | — | — | Caption Exact Reported | 6695 · 3.2 · Figure 1b |
| CF-2 thickness after 24 h OER | 6-8 nm | — | range 6-8 | Text Range | 6697 · 3.3 · Figure S20 |
| CF-2 AFM thicknessMarked as a best value within this paper | 3 nm | — | — | Text Rounded Reported | 6695 · 3.2 · Figure S15 |
| CF-2 TEM upstanding layer thickness | 3-4 nm | — | range 3-4 | Text Range | 6695 · 3.2 · Figure 1a |
| CF-3 HRTEM lattice spacing | 0.46 nm | — | — | Caption Exact Reported | S-13 · 6. Figures · Figure S14 |
| CF-4 HRTEM lattice spacing | 0.46 nm | — | — | Caption Exact Reported | S-13 · 6. Figures · Figure S14 |
| layered hydroxide interplanar distance | 0.74 nm | — | — | Text Exact Reported | 6695 · 3.2 · Figure S13 |