Powder X-ray diffraction with Cu Kalpha radiation, 0.02 degree step
SSP@ZIF-8-10% membrane · Thin Film
XRD of ZIF-8 and SSP@ZIF-8-10%; SI XRD of 1%, 5%, and 20% membranes.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| ZIF-8 phase retained after SSP encapsulation | XRD patterns indicate formation of ZIF-8 phase with SSP inside the membranes | — | — | Text Qualitative | 2 · Results and discussion · Figure 2c; Figure S3 |