Diffraction Structure — Semiconducting neutral microstructures fabricated by coordinative self-assembly of intramolecular charge-transfer tetrathiafulvalene derivatives

Measurement evidence

Diffraction Structure

Semiconducting neutral microstructures fabricated by coordinative self-assembly of intramolecular charge-transfer tetrathiafulvalene derivatives · Geng Y., Wang X.-J., Chen B. et al. · Chemistry - A European Journal · 2009 · 5124-5129

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction

TTF-Pb coordination-polymer microwires · Powder

XRD of the microstructures used to evaluate intermolecular interactions and pi-pi stacking.

Context
target coordination-polymer microstructures
Measurement source
5127 · Results and Discussion · Figure S15 referenced
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
XRD peak assigned to pi-pi stacking2theta = 22.98Text
Exact Reported
5127 · Results and Discussion · Figure S15 referenced
intermolecular pi-pi stacking distancedistance 3.9 Angstrom0.39 nmText
Exact Reported
S17 · Supporting Information · Figure S15

Powder X-ray diffraction

TTF-Zn spherical coordination-polymer particles · Powder

XRD pattern of Zn-linked spherical particles in SI Figure S15(b), compared with microwires.

Context
pristine Zn2+-linked target sample
Measurement source
S17 · Supporting Information · Figure S15b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Zn spherical-particle XRD stacking distance label3.9 A0.39 nmFigure Axis
Rounded Reported
S17 · Supporting Information · Figure S15b