Electrical Transport — Facile synthesis and characterization of trimesic acid-Cu based metal organic frameworks

Measurement evidence

Electrical Transport

Facile synthesis and characterization of trimesic acid-Cu based metal organic frameworks · Sahiner N., Sel K., Ozturk O.F. et al. · Applied Surface Science · 2014 · 663-669

7 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Current-voltage (I-V) conductivity measurement with Keithley 2400 electrometer

TMA-Cu(CH3COOH)2 (DIW) · Powder

Room temperature transverse current path on pressed dry MOF disk

Geometry
pressed disk, area about 1.12 cm2, thickness about 1 mm; conductive carbon tape top and bottom electrodes
Context
pristine TMA-Cu MOF sample
Measurement source
3 · 2.5 Conductivity analysis · Fig. 6; Table 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrical conductivity4.16E-10Table
Exact Reported
6 · 3.3 Conductivity measurements · Table 4

Current-voltage (I-V) conductivity measurement with Keithley 2400 electrometer

TMA-Cu(CH3COOH)2 (EtOH) · Powder

Room temperature transverse current path on pressed dry MOF disk

Geometry
pressed disk, area about 1.12 cm2, thickness about 1 mm; conductive carbon tape top and bottom electrodes
Context
pristine TMA-Cu MOF sample
Measurement source
3 · 2.5 Conductivity analysis · Fig. 6; Table 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrical conductivity5.13E-09Table
Exact Reported
6 · 3.3 Conductivity measurements · Table 4

Current-voltage (I-V) conductivity measurement with Keithley 2400 electrometer

TMA-CuCl2 (DIW) · Powder

Room temperature transverse current path on pressed dry MOF disk

Geometry
pressed disk, area about 1.12 cm2, thickness about 1 mm; conductive carbon tape top and bottom electrodes
Context
pristine TMA-Cu MOF sample
Measurement source
3 · 2.5 Conductivity analysis · Fig. 6; Table 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrical conductivityMarked as a best value within this paper8.26E-08Table
Exact Reported
6 · 3.3 Conductivity measurements · Table 4

Current-voltage (I-V) conductivity measurement with Keithley 2400 electrometer

TMA-Cu(NO3)2 (DIW) · Powder

Room temperature transverse current path on pressed dry MOF disk

Geometry
pressed disk, area about 1.12 cm2, thickness about 1 mm; conductive carbon tape top and bottom electrodes
Context
pristine TMA-Cu MOF sample
Measurement source
3 · 2.5 Conductivity analysis · Fig. 6; Table 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrical conductivity3.12E-08Table
Exact Reported
6 · 3.3 Conductivity measurements · Table 4

Current-voltage (I-V) conductivity measurement with Keithley 2400 electrometer

TMA-Cu(NO3)2 (EtOH) · Powder

Room temperature transverse current path on pressed dry MOF disk

Geometry
pressed disk, area about 1.12 cm2, thickness about 1 mm; conductive carbon tape top and bottom electrodes
Context
pristine TMA-Cu MOF sample
Measurement source
3 · 2.5 Conductivity analysis · Fig. 6; Table 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrical conductivity5.29E-11Table
Exact Reported
6 · 3.3 Conductivity measurements · Table 4

Current-voltage (I-V) conductivity measurement with Keithley 2400 electrometer

TMA-Cu(SO4)2 (DIW) · Powder

Room temperature transverse current path on pressed dry MOF disk

Geometry
pressed disk, area about 1.12 cm2, thickness about 1 mm; conductive carbon tape top and bottom electrodes
Context
pristine TMA-Cu MOF sample
Measurement source
3 · 2.5 Conductivity analysis · Fig. 6; Table 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrical conductivity7.47E-10Table
Exact Reported
6 · 3.3 Conductivity measurements · Table 4

Current-voltage (I-V) conductivity measurement with Keithley 2400 electrometer

TMA-Cu(SO4)2 (EtOH) · Powder

Room temperature transverse current path on pressed dry MOF disk

Geometry
pressed disk, area about 1.12 cm2, thickness about 1 mm; conductive carbon tape top and bottom electrodes
Context
pristine TMA-Cu MOF sample
Measurement source
3 · 2.5 Conductivity analysis · Fig. 6; Table 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrical conductivity6.92E-11Table
Exact Reported
6 · 3.3 Conductivity measurements · Table 4