Powder X-ray diffraction (PXRD) using Panalytical X'pert-Pro diffractometer
DZTGD single crystal · Single Crystal
PXRD pattern used for crystallinity and cell-volume comparison
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| First high-intensity PXRD peak position | 2θ = 11.44° | — | — | Text Exact Reported | 3 · 4.2 PXRD analysis · Fig. 4 |
| First high-intensity PXRD peak intensity | 5507.67 au | — | — | Text Exact Reported | 3 · 4.2 PXRD analysis · Fig. 4 |
| Second PXRD peak position | 2θ = 22.03° | — | — | Text Exact Reported | 3 · 4.2 PXRD analysis · Fig. 4 |
| Second PXRD peak intensity | 897.01 au | — | — | Text Exact Reported | 3 · 4.2 PXRD analysis · Fig. 4 |
| Third PXRD peak position | 2θ = 12.13° | — | — | Text Exact Reported | 3 · 4.2 PXRD analysis · Fig. 4 |
| Third PXRD peak intensity | 847.78 au | — | — | Text Exact Reported | 3 · 4.2 PXRD analysis · Fig. 4 |
| PXRD-derived unit cell volume | 777.3280(4) A0 3 | — | (4) | Text Exact Reported | 3 · 4.2 PXRD analysis |