Microscopy Morphology — Rational design of sulfur vacancy-rich NiCo2S4/C nanostructure for high-performance hybrid supercapacitors

Measurement evidence

Microscopy Morphology

Rational design of sulfur vacancy-rich NiCo2S4/C nanostructure for high-performance hybrid supercapacitors · Tian J., Guo H., Wang M. et al. · Journal of Alloys and Compounds · 2024 · 173949

5 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and EDS mapping

NCO · Powder

SEM micrographs and length distribution histograms for NCO.

Context
oxide control
Measurement source
6 · 3.1 · Fig. 2e-h,r
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average rod length6.22 +/- 0.56 um+/- 0.56 umFigure Axis
Exact Reported
6 · 3.1 · Fig. 2r

SEM and EDS mapping

NCS · Powder

SEM micrographs and length distribution histograms for NCS.

Context
pure sulfide control
Measurement source
6 · 3.1 · Fig. 2i-l,s
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average rod length6.03 +/- 0.87 um+/- 0.87 umFigure Axis
Exact Reported
6 · 3.1 · Fig. 2s

SEM and EDS mapping

NCSC · Powder

SEM micrographs and length distribution histograms for NCSC.

Context
target composite
Measurement source
6 · 3.1 · Fig. 2m-p,t
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average rod length5.59 +/- 0.66 um+/- 0.66 umFigure Axis
Exact Reported
6 · 3.1 · Fig. 2t

SEM and EDS mapping

Ni1Co1-BTC · Powder

SEM micrographs and length distribution histograms for Ni1Co1-BTC.

Context
MOF precursor
Measurement source
3 · 3.1 · Fig. 2a-d,q
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average rod length7.74 +/- 0.67 um+/- 0.67 umFigure Axis
Exact Reported
6 · 3.1 · Fig. 2q

TEM, HRTEM, SAED, FFT

NCSC · Powder

TEM and electron diffraction at 200 kV; lattice spacing analysis.

Context
target composite
Measurement source
7 · 3.1 · Fig. 3i-n
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
HRTEM lattice spacing, (311) plane0.280 nmText
Exact Reported
7 · 3.1 · Fig. 3m-n
HRTEM lattice spacing, (400) plane0.235 nmText
Exact Reported
7 · 3.1 · Fig. 3m-n