| CoHHTP-1C/CuHHTP-5Cresearch_0683__mat__mat_co_hhtp | Thin Film · Composite Sample · Composite | 1 overlayer LBL cycle after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate · Co overlayer 1 cycle on CuHHTP-5C; exact thickness not text-reported | 4 · Results · Fig. 3a |
| CoHHTP-3C/CuHHTP-5Cresearch_0683__mat__mat_co_hhtp | Thin Film · Composite Sample · Composite | 3 overlayer LBL cycles after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate · Co overlayer 3 cycles on CuHHTP-5C; exact thickness not text-reported | 4 · Results · Fig. 3a |
| CoHHTP-5C/CuHHTP-5Cresearch_0683__mat__mat_co_hhtp | Thin Film · Composite Sample · Composite | 5 overlayer LBL cycles after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate · Co overlayer 5 cycles on CuHHTP-5C; exact thickness not text-reported | 4 · Results · Fig. 3a |
| CoHHTP-7C/CuHHTP-5Cresearch_0683__mat__mat_co_hhtp | Thin Film · Target Sample · Composite | 7 overlayer LBL cycles after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate; uLED substrate for TMA optimised device · Co overlayer 7 cycles on CuHHTP-5C; exact thickness not text-reported | 7 · Results · Fig. 5e |
| Co3HHTP2 monolayer DFT modelresearch_0683__mat__mat_co_hhtp | Model · Model System · Model | DFT model20 Angstrom vacuum slab · monolayer model | 9 · Methods - DFT calculations · Fig. 4 |
| CuHHTP-11Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Pristine Control · Pristine Framework | 11 LBL cyclesAu-interdigitated silicon substrate · Thickness increased with coating cycles; exact value not text-reported | 4 · Results · Fig. 2d |
| CuHHTP-13Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Pristine Control · Pristine Framework | 13 LBL cyclesAu-interdigitated silicon substrate · Thickness increased with coating cycles; exact value not text-reported | 4 · Results · Fig. 2d |
| CuHHTP-15Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | 15 LBL cyclesAu-interdigitated silicon substrate; uLED substrate for EtOH optimised device · Thickness increased with coating cycles; exact value not text-reported | 7 · Results · Fig. 5e |
| CuHHTP-1Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Pristine Control · Pristine Framework | 1 LBL cycleAu-interdigitated silicon substrate or Si substrate · Too thin to be measured accurately in Supplementary Fig. 4 | 11 · Supplementary Figures · Supplementary Fig. 4 |
| CuHHTP-3Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Pristine Control · Pristine Framework | 3 LBL cyclesAu-interdigitated silicon substrate or Si substrate · Discontinuities in cross-sectional view | 11 · Supplementary Figures · Supplementary Fig. 4 |
| CuHHTP-5Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Pristine Control · Pristine Framework | 5 LBL cyclesAu-interdigitated silicon substrate; also integrated on uLED substrate for devices · 108 nm in main text; 108.80597014925372 nm source-data mean | 4 · Results · Fig. 2c |
| CuHHTP-5C on micro-LED platformresearch_0683__mat__mat_cu_hhtp | Electrode · Target Sample · Composite | monolithic photoactivated cMOF-uLED array sensoruLED platform with SiO2 insulation and Au interdigitated electrode · CuHHTP-5C; cMOF-light-source distance 1 um | 6 · Integration of cMOFs and uLP · Fig. 5a-c |
| CuHHTP-7Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Pristine Control · Pristine Framework | 7 LBL cyclesAu-interdigitated silicon substrate · Thickness increased with coating cycles; exact value not text-reported | 4 · Results · Fig. 2d |
| CuHHTP-9Cresearch_0683__mat__mat_cu_hhtp | Thin Film · Pristine Control · Pristine Framework | 9 LBL cyclesAu-interdigitated silicon substrate · Thickness increased with coating cycles; exact value not text-reported | 4 · Results · Fig. 2d |
| Cu3HHTP2 monolayer DFT modelresearch_0683__mat__mat_cu_hhtp | Model · Model System · Model | DFT model20 Angstrom vacuum slab · monolayer model | 9 · Methods - DFT calculations · Fig. 4 |
| Cu3HHTP2 powdersresearch_0683__mat__mat_cu_hhtp | Powder · Pristine Control · Pristine Framework | crystalline powder reference for Raman/PXRD comparison | 3 · Results · Fig. 2b |
| NiHHTP-1C/CuHHTP-5Cresearch_0683__mat__mat_ni_hhtp | Thin Film · Composite Sample · Composite | 1 overlayer LBL cycle after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate · Ni overlayer 1 cycle on CuHHTP-5C; exact thickness not text-reported | 4 · Results · Fig. 3a |
| NiHHTP-3C/CuHHTP-5Cresearch_0683__mat__mat_ni_hhtp | Thin Film · Composite Sample · Composite | 3 overlayer LBL cycles after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate · Ni overlayer 3 cycles on CuHHTP-5C; exact thickness not text-reported | 4 · Results · Fig. 3a |
| NiHHTP-5C/CuHHTP-5Cresearch_0683__mat__mat_ni_hhtp | Thin Film · Composite Sample · Composite | 5 overlayer LBL cycles after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate · Ni overlayer 5 cycles on CuHHTP-5C; exact thickness not text-reported | 4 · Results · Fig. 3a |
| NiHHTP-7C/CuHHTP-5Cresearch_0683__mat__mat_ni_hhtp | Thin Film · Composite Sample · Composite | 7 overlayer LBL cycles after 5 CuHHTP cyclesCuHHTP-5C on Au-interdigitated silicon substrate · Ni overlayer 7 cycles on CuHHTP-5C; exact thickness not text-reported | 5 · Results · Fig. 3b; Supplementary Fig. 15 |
| Ni3HHTP2 monolayer DFT modelresearch_0683__mat__mat_ni_hhtp | Model · Model System · Model | DFT model20 Angstrom vacuum slab · monolayer model | 9 · Methods - DFT calculations · Fig. 4 |