Microscopy Morphology — Probing the electronic and ionic transport in topologically distinct redox-active metal-organic frameworks in aqueous electrolytes

2 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

All powder materials: MOF-808, Mn-MOF-808, UiO-66, Mn-UiO-66, CAU-24 and Mn-CAU-24 · Powder

Cross-sectional SEM of Mn-MOF-808, Mn-UiO-66 and Mn-CAU-24 drop-cast thin films.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Mn concentration in whole Mn-CAU-24 film including interparticle volume	324 mol/m3	—	—	Text Exact Reported	S-19 · Supporting Information · Figure S16 discussion
Mn concentration in whole Mn-MOF-808 film including interparticle volume	358 mol/m3	—	—	Text Exact Reported	S-19 · Supporting Information · Figure S16 discussion
Mn concentration in whole Mn-UiO-66 film including interparticle volume	248 mol/m3	—	—	Text Exact Reported	S-19 · Supporting Information · Figure S16 discussion
Average film thickness of Mn-CAU-24	25 um	—	estimated	Text Approximate	9863 · Results and discussion - Chronoamperometric studies · Figure S15
Average film thickness of Mn-MOF-808	48 um	—	estimated	Text Approximate	9863 · Results and discussion - Chronoamperometric studies · Figure S15
Average film thickness of Mn-UiO-66	33 um	—	estimated	Text Approximate	9863 · Results and discussion - Chronoamperometric studies · Figure S15

All powder materials: MOF-808, Mn-MOF-808, UiO-66, Mn-UiO-66, CAU-24 and Mn-CAU-24 · Powder

SEM images of six powders; low-magnification SEM, EDS line scans/maps and TEM in SI.

Context: Pristine and Mn-decorated powders compared for morphology and Mn dispersion.
Measurement source: 9859 · Results and discussion - Materials characterization · Figure 3; Figures S2-S5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Mn spatial distribution	Mn sites uniformly distributed in all three Mn-decorated MOF crystals	—	—	Text Qualitative	9859 · Results and discussion - Materials characterization · Figures S3-S4
MOF-808 crystal size	average crystal size around 400 nm	—	around	Text Approximate	9859 · Results and discussion - Materials characterization · Figure 3
Defective UiO-66 crystal size range upper bound	80 nm to 250 nm	—	range	Text Range	9859 · Results and discussion - Materials characterization · Figure 3
Defective UiO-66 crystal size range lower bound	80 nm to 250 nm	—	range	Text Range	9859 · Results and discussion - Materials characterization · Figure 3