Diffraction Structure — Cu/Co bimetallic conductive MOFs: Electronic modulation for enhanced nitrate reduction to ammonia

Measurement evidence

Diffraction Structure

Cu/Co bimetallic conductive MOFs: Electronic modulation for enhanced nitrate reduction to ammonia · Liu P., Yan J., Huang H. et al. · Chemical Engineering Journal · 2023 · 143134

6 measurement groups · 26 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

post-electrolysis XRD/SEM/HRTEM

X-ray diffraction and scattering Scanning electron microscopy Transmission electron microscopy

Cu1Co1HHTP powder · Powder

Structure and morphology after cycling stability test

Measurement source: 5 · 3.2 · Figures S32-S33

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu1Co1HHTP post-cycling HRTEM (001) spacing	0.326 nm	—	—	Text Exact Reported	5 · 3.2 · Figure S33c
Cu1Co1HHTP post-cycling SEM aggregate size	60-100 nm	—	—	Text Range	5 · 3.2 · Figure S33a,b

powder X-ray diffraction

X-ray diffraction and scattering

CoHHTP powder · Powder

Powder XRD for phase/stacking assignment of serial HHTP MOFs

Measurement source: 2-3 · 3.1 · Fig. 1b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
CoHHTP refined lattice parameter a	21.15089 +/- 0.04239 Angstrom	—	+/- 0.04239 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CoHHTP refined lattice parameter alpha	90.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CoHHTP refined lattice parameter b	21.15089 +/- 0.04239 Angstrom	—	+/- 0.04239 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CoHHTP refined lattice parameter beta	90.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CoHHTP refined lattice parameter c	3.08596 +/- 0.02641 Angstrom	—	+/- 0.02641 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CoHHTP refined lattice parameter gamma	120.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CoHHTP (100) XRD peak	4.82 degree	—	—	Text Exact Reported	2 · 3.1 · Fig. 1b

powder X-ray diffraction

X-ray diffraction and scattering

Cu1Co1HHTP powder · Powder

Powder XRD for phase/stacking assignment of serial HHTP MOFs

Measurement source: 2-3 · 3.1 · Fig. 1b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu1Co1HHTP refined lattice parameter a	21.53350 +/- 0.16304 Angstrom	—	+/- 0.16304 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
Cu1Co1HHTP refined lattice parameter alpha	90.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
Cu1Co1HHTP refined lattice parameter b	21.53350 +/- 0.16304 Angstrom	—	+/- 0.16304 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
Cu1Co1HHTP refined lattice parameter beta	90.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
Cu1Co1HHTP refined lattice parameter c	3.30000 +/- 0.03689 Angstrom	—	+/- 0.03689 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
Cu1Co1HHTP refined lattice parameter gamma	120.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
bimetallic CuxCoyHHTP (100) shift with Co content	shift to 4.82 degree	—	—	Text Rounded Reported	2 · 3.1 · Fig. 1b

powder X-ray diffraction

X-ray diffraction and scattering

Cu1Co2HHTP powder · Powder

Powder XRD for phase/stacking assignment of serial HHTP MOFs

Measurement source: 2-3 · 3.1 · Fig. 1b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source

powder X-ray diffraction

X-ray diffraction and scattering

Cu2Co1HHTP powder · Powder

Powder XRD for phase/stacking assignment of serial HHTP MOFs

Measurement source: 2-3 · 3.1 · Fig. 1b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source

powder X-ray diffraction

X-ray diffraction and scattering

CuHHTP powder · Powder

Powder XRD for phase/stacking assignment of serial HHTP MOFs

Measurement source: 2-3 · 3.1 · Fig. 1b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
CuHHTP refined lattice parameter a	22.38775 +/- 0.17902 Angstrom	—	+/- 0.17902 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CuHHTP refined lattice parameter alpha	90.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CuHHTP refined lattice parameter b	22.38775 +/- 0.17902 Angstrom	—	+/- 0.17902 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CuHHTP refined lattice parameter beta	90.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CuHHTP refined lattice parameter c	3.46656 +/- 0.02766 Angstrom	—	+/- 0.02766 Angstrom	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CuHHTP refined lattice parameter gamma	120.00000 degree	—	—	SI Table Exact Reported	16-17 · Experimental and theoretical data · Table S1
CuHHTP (002) XRD peak	27.88 degree	—	—	Text Exact Reported	2 · 3.1 · Fig. 1b
CuHHTP (100) XRD peak	4.66 degree	—	—	Text Exact Reported	2 · 3.1 · Fig. 1b
CuHHTP (200) XRD peak	9.52 degree	—	—	Text Exact Reported	2 · 3.1 · Fig. 1b
CuHHTP (210) XRD peak	12.62 degree	—	—	Text Exact Reported	2 · 3.1 · Fig. 1b